David Rotolo
Engineering Professional
About
Education
RENSSELAER POLYTECHNIC INSTITUTE
Master of Science
RENSSELAER POLYTECHNIC INSTITUTE
Bachelor of Science
Experience
Microchip Technology Inc.
Staff Yield Enhancement and Device Engineer / 2016 — 2023
Charged with responsibility for devices and product yields for BiCMOS (Bipolar and CMOS) and BCD (BiCMOS and DMOS) processes. Guided process adjustments to bring products into parametric and datasheet specifications for a fab transfer. Improved yields by determining root cause of device parametric failures for production product wafers. Worked with Process and Design Engineers to improve yields by at least 2% on several products. Spearheaded the removal of inferior inspections to reduce cycle time and improve yields. Eliminated intermittent wafer scraps by selecting a robust process on a family of products. Created a synergy among internal groups to produce a "saw map gds" per customer request. Augmented efficacy of several groups by giving technical feedback on BiCMOS and BCD process integration effects.
MICREL
Senior Device Development and Integration Engineer / 2010 — 2016
Completed enhancements to layouts of test patterns and PCMs. Identified cause of device parametric failures for production product wafers. Followed characterizations of DMOS and BJT devices. Developed simple models in Silvaco ATHENA and ATLAS to evaluate minimum design rules.
QUICKSIL
Product and Parametric Test Engineer / 2007 — 2010
Conducted product engineering for transient voltage suppression (TVS) devices photodiodes capacitors resistors and fuses; designed performed and evaluated experimental lot splits investigated process steps failure analysis and qualified vendors. Orchestrated the creation of DC parametric tests for TVS MOS BJT diode photodiode Van der Pauw capacitor and resistor structures for a Reedholm parametric tester; developed parametric tests and wafer sort programs on a HP 4062 UX with RMB BASIC.
HITACHI
Process Metrology Engineer Staff Scientist Manufacturing / 2000 — 2007
Executed all duties related to improvement introduction and statistical control of magnetic metrology equipment; BH Hysteresis Loop Tracer Vibrating Sample Magnetometer (VSM) Surface Magneto-Optic Kerr Effect Magnetometer (MOKE) Magnetostriction Measurement (both direct and indirect) X-Ray Florescence (XRF) and X-Ray Diffraction (XRD) instruments. Worked hand-in-hand with process engineers and scientists in; statistics magnetics metrology GMR sensor physics general physics and mathematics to offer feedback and recommendations. Boosted yield by 0.25% by calculating and utilizing the volumetric moment of a magnetic film by combining results of numerous types of metrology equipment.
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